Keyence VK-X150 3D Laser Scanning Confocal Microscope Complete System

$18,995.00

The Keyence VK-X150 is a 3D laser scanning confocal microscope designed for non-contact surface imaging, profile measurement, surface roughness analysis, height measurement, and three-dimensional reconstruction.

This complete system includes the VK-X150 measuring head, VK-X150K main controller, VK-S1000K electric stage controller, motorized intelligent XY stage, four objectives, and a Dell Precision 3450 control workstation with the Keyence VK-X software environment installed and operating with the instrument.

A complete end-to-end laser-confocal measurement was successfully performed. Testing demonstrated optical color imaging, laser imaging, automatic Z-range detection, Z-axis scanning, 3D reconstruction, quantitative profile measurement, motorized stage control, and data capture.

Features

  • Non-contact three-dimensional surface measurement

  • Pinhole confocal optical system

  • Optical color imaging

  • 658 nm red semiconductor laser

  • Automatic Z-range detection

  • Three-dimensional surface reconstruction

  • Surface profile and height measurement

  • Motorized intelligent XY sample stage

  • Four-position objective turret

  • Complete 10×, 20×, 50×, and 100× objective set

  • Computer-based digital viewing

  • Keyence VK-X software installed on the included workstation

  • Suitable for surface texture, roughness, profile, height, and dimensional analysis

  • Designed for materials science, manufacturing, quality control, engineering, research, and failure analysis

Specifications

  • Manufacturer: Keyence

  • System Model: VK-X150

  • Product Type: 3D Laser Scanning Confocal Microscope

  • Series: VK-X100/X200

  • Main Controller: VK-X150K

  • Main Controller Serial Number: 1271011

  • Electric Stage Controller: VK-S1000K

  • Stage Controller Serial Number: 4B710001

  • Stage Type: Motorized Intelligent XY Auto Stage

  • Optical System: Pinhole Confocal

  • Laser Type: Red Semiconductor Laser

  • Laser Wavelength: 658 nm

  • Maximum Laser Output: 0.95 mW

  • Laser Classification: Class 2

  • Light-Receiving Element: 16-bit photomultiplier

  • Maximum Total Magnification: Up to 19,200×, depending on configuration

  • Field of View: Approximately 16 µm to 5,400 µm, depending on configuration

  • Laser Measurement Speed: 4 to 120 Hz

  • High-Speed Line Scanning: Up to 7,900 Hz

  • Objective Magnifications: 10×, 20×, 50×, and 100×

  • Manufacturing Date: April 2017

  • Country of Origin: Japan

Included Computer Specifications

  • Manufacturer: Dell

  • Model: Precision 3450

  • Processor: Intel Xeon W-1370

  • Processor Configuration: 8 cores / 16 threads

  • Memory: 16 GB RAM

  • Storage: 1 TB NVMe SSD

  • Operating System: Windows 10 Pro for Workstations

  • Installed Software: VK Viewer 2.8.1

  • Installed Software: VK Analyzer 3.8.0

  • Installed Software: Image Stitching 2.1.1

  • Remote-Control SDK installed

Documented Functional Test

A live laser-confocal measurement was performed at 10× magnification using a printed reference target.

The following functions were successfully demonstrated:

  • System and controllers power on

  • Communication between the instrument, controllers, and computer

  • Optical color image acquisition

  • Optical focus and resolution

  • 658 nm confocal laser imaging

  • Automatic Z height-range detection

  • Z-axis scanning

  • Three-dimensional surface reconstruction

  • Quantitative line-profile measurement

  • Motorized XY stage movement in all directions

  • Encoder position tracking

  • Measurement data capture and .vk4 file saving

Documented test results included:

  • Horizontal Profile Distance: 1,397.873 µm

  • Height Difference: 108.495 µm

  • Average Height: 137.194 µm

  • Profile Tilt: 4.438°

  • Automatic Z Scan Range: 393.345 µm

These values document the completed functional test and are not being represented as calibration standards or guaranteed performance specifications.

Included

  • Keyence VK-X150 measuring head and microscope stand

  • Keyence VK-X150K main controller

  • Keyence VK-S1000K electric stage controller

  • Motorized intelligent XY auto stage

  • 10× objective

  • 20× objective

  • 50× objective

  • 100× objective

  • Dell Precision 3450 control computer

  • Installed Keyence VK-X software environment

  • Interconnecting and power cables used during testing

Includes all accessories shown in the photographs.

Monitor, keyboard, mouse, sample, calibration standards, and accessories not shown or specifically identified are not included.

Condition

Pre-owned and cosmetically clean, with minor marks and signs consistent with previous laboratory or industrial use. No significant exterior damage was observed.

The system was assembled and tested through a complete laser-confocal 3D measurement. Optical imaging, color camera operation, laser imaging, automatic Z-range detection, Z scanning, 3D reconstruction, quantitative measurement, motorized XY stage control, and data capture were successfully demonstrated.

During initial startup, the motorized XY stage was positioned against a travel limit and stalled during the origin-return routine. After the stage was moved to a mid-travel position, it moved freely in all directions, and the position encoders tracked movement correctly.

The XY stage produces an audible buzzing or mechanical operating sound during movement. The stage moved and tracked accurately during testing, but the source of the sound was not further characterized. The buyer should reconfirm the origin-return procedure from a mid-travel position after installation.

The included software was used successfully with this instrument during testing. Future software-license transfer, updates, compatibility, and manufacturer support are not guaranteed.

The system is not represented as newly calibrated or manufacturer-certified. Installation, leveling, application-specific qualification, and verification of measurement performance are the buyer’s responsibility.

Shipping

Freight shipping is available throughout the United States. Shipping costs are quoted separately based on destination, delivery requirements, and final shipment dimensions.

Local pickup is available in San Diego, California.

Please complete the Freight & Local Pickup Request Form before purchasing to receive an accurate freight quote.

The Keyence VK-X150 is a 3D laser scanning confocal microscope designed for non-contact surface imaging, profile measurement, surface roughness analysis, height measurement, and three-dimensional reconstruction.

This complete system includes the VK-X150 measuring head, VK-X150K main controller, VK-S1000K electric stage controller, motorized intelligent XY stage, four objectives, and a Dell Precision 3450 control workstation with the Keyence VK-X software environment installed and operating with the instrument.

A complete end-to-end laser-confocal measurement was successfully performed. Testing demonstrated optical color imaging, laser imaging, automatic Z-range detection, Z-axis scanning, 3D reconstruction, quantitative profile measurement, motorized stage control, and data capture.

Features

  • Non-contact three-dimensional surface measurement

  • Pinhole confocal optical system

  • Optical color imaging

  • 658 nm red semiconductor laser

  • Automatic Z-range detection

  • Three-dimensional surface reconstruction

  • Surface profile and height measurement

  • Motorized intelligent XY sample stage

  • Four-position objective turret

  • Complete 10×, 20×, 50×, and 100× objective set

  • Computer-based digital viewing

  • Keyence VK-X software installed on the included workstation

  • Suitable for surface texture, roughness, profile, height, and dimensional analysis

  • Designed for materials science, manufacturing, quality control, engineering, research, and failure analysis

Specifications

  • Manufacturer: Keyence

  • System Model: VK-X150

  • Product Type: 3D Laser Scanning Confocal Microscope

  • Series: VK-X100/X200

  • Main Controller: VK-X150K

  • Main Controller Serial Number: 1271011

  • Electric Stage Controller: VK-S1000K

  • Stage Controller Serial Number: 4B710001

  • Stage Type: Motorized Intelligent XY Auto Stage

  • Optical System: Pinhole Confocal

  • Laser Type: Red Semiconductor Laser

  • Laser Wavelength: 658 nm

  • Maximum Laser Output: 0.95 mW

  • Laser Classification: Class 2

  • Light-Receiving Element: 16-bit photomultiplier

  • Maximum Total Magnification: Up to 19,200×, depending on configuration

  • Field of View: Approximately 16 µm to 5,400 µm, depending on configuration

  • Laser Measurement Speed: 4 to 120 Hz

  • High-Speed Line Scanning: Up to 7,900 Hz

  • Objective Magnifications: 10×, 20×, 50×, and 100×

  • Manufacturing Date: April 2017

  • Country of Origin: Japan

Included Computer Specifications

  • Manufacturer: Dell

  • Model: Precision 3450

  • Processor: Intel Xeon W-1370

  • Processor Configuration: 8 cores / 16 threads

  • Memory: 16 GB RAM

  • Storage: 1 TB NVMe SSD

  • Operating System: Windows 10 Pro for Workstations

  • Installed Software: VK Viewer 2.8.1

  • Installed Software: VK Analyzer 3.8.0

  • Installed Software: Image Stitching 2.1.1

  • Remote-Control SDK installed

Documented Functional Test

A live laser-confocal measurement was performed at 10× magnification using a printed reference target.

The following functions were successfully demonstrated:

  • System and controllers power on

  • Communication between the instrument, controllers, and computer

  • Optical color image acquisition

  • Optical focus and resolution

  • 658 nm confocal laser imaging

  • Automatic Z height-range detection

  • Z-axis scanning

  • Three-dimensional surface reconstruction

  • Quantitative line-profile measurement

  • Motorized XY stage movement in all directions

  • Encoder position tracking

  • Measurement data capture and .vk4 file saving

Documented test results included:

  • Horizontal Profile Distance: 1,397.873 µm

  • Height Difference: 108.495 µm

  • Average Height: 137.194 µm

  • Profile Tilt: 4.438°

  • Automatic Z Scan Range: 393.345 µm

These values document the completed functional test and are not being represented as calibration standards or guaranteed performance specifications.

Included

  • Keyence VK-X150 measuring head and microscope stand

  • Keyence VK-X150K main controller

  • Keyence VK-S1000K electric stage controller

  • Motorized intelligent XY auto stage

  • 10× objective

  • 20× objective

  • 50× objective

  • 100× objective

  • Dell Precision 3450 control computer

  • Installed Keyence VK-X software environment

  • Interconnecting and power cables used during testing

Includes all accessories shown in the photographs.

Monitor, keyboard, mouse, sample, calibration standards, and accessories not shown or specifically identified are not included.

Condition

Pre-owned and cosmetically clean, with minor marks and signs consistent with previous laboratory or industrial use. No significant exterior damage was observed.

The system was assembled and tested through a complete laser-confocal 3D measurement. Optical imaging, color camera operation, laser imaging, automatic Z-range detection, Z scanning, 3D reconstruction, quantitative measurement, motorized XY stage control, and data capture were successfully demonstrated.

During initial startup, the motorized XY stage was positioned against a travel limit and stalled during the origin-return routine. After the stage was moved to a mid-travel position, it moved freely in all directions, and the position encoders tracked movement correctly.

The XY stage produces an audible buzzing or mechanical operating sound during movement. The stage moved and tracked accurately during testing, but the source of the sound was not further characterized. The buyer should reconfirm the origin-return procedure from a mid-travel position after installation.

The included software was used successfully with this instrument during testing. Future software-license transfer, updates, compatibility, and manufacturer support are not guaranteed.

The system is not represented as newly calibrated or manufacturer-certified. Installation, leveling, application-specific qualification, and verification of measurement performance are the buyer’s responsibility.

Shipping

Freight shipping is available throughout the United States. Shipping costs are quoted separately based on destination, delivery requirements, and final shipment dimensions.

Local pickup is available in San Diego, California.

Please complete the Freight & Local Pickup Request Form before purchasing to receive an accurate freight quote.