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Keyence VK-X150 3D Laser Scanning Confocal Microscope Complete System
The Keyence VK-X150 is a 3D laser scanning confocal microscope designed for non-contact surface imaging, profile measurement, surface roughness analysis, height measurement, and three-dimensional reconstruction.
This complete system includes the VK-X150 measuring head, VK-X150K main controller, VK-S1000K electric stage controller, motorized intelligent XY stage, four objectives, and a Dell Precision 3450 control workstation with the Keyence VK-X software environment installed and operating with the instrument.
A complete end-to-end laser-confocal measurement was successfully performed. Testing demonstrated optical color imaging, laser imaging, automatic Z-range detection, Z-axis scanning, 3D reconstruction, quantitative profile measurement, motorized stage control, and data capture.
Features
Non-contact three-dimensional surface measurement
Pinhole confocal optical system
Optical color imaging
658 nm red semiconductor laser
Automatic Z-range detection
Three-dimensional surface reconstruction
Surface profile and height measurement
Motorized intelligent XY sample stage
Four-position objective turret
Complete 10×, 20×, 50×, and 100× objective set
Computer-based digital viewing
Keyence VK-X software installed on the included workstation
Suitable for surface texture, roughness, profile, height, and dimensional analysis
Designed for materials science, manufacturing, quality control, engineering, research, and failure analysis
Specifications
Manufacturer: Keyence
System Model: VK-X150
Product Type: 3D Laser Scanning Confocal Microscope
Series: VK-X100/X200
Main Controller: VK-X150K
Main Controller Serial Number: 1271011
Electric Stage Controller: VK-S1000K
Stage Controller Serial Number: 4B710001
Stage Type: Motorized Intelligent XY Auto Stage
Optical System: Pinhole Confocal
Laser Type: Red Semiconductor Laser
Laser Wavelength: 658 nm
Maximum Laser Output: 0.95 mW
Laser Classification: Class 2
Light-Receiving Element: 16-bit photomultiplier
Maximum Total Magnification: Up to 19,200×, depending on configuration
Field of View: Approximately 16 µm to 5,400 µm, depending on configuration
Laser Measurement Speed: 4 to 120 Hz
High-Speed Line Scanning: Up to 7,900 Hz
Objective Magnifications: 10×, 20×, 50×, and 100×
Manufacturing Date: April 2017
Country of Origin: Japan
Included Computer Specifications
Manufacturer: Dell
Model: Precision 3450
Processor: Intel Xeon W-1370
Processor Configuration: 8 cores / 16 threads
Memory: 16 GB RAM
Storage: 1 TB NVMe SSD
Operating System: Windows 10 Pro for Workstations
Installed Software: VK Viewer 2.8.1
Installed Software: VK Analyzer 3.8.0
Installed Software: Image Stitching 2.1.1
Remote-Control SDK installed
Documented Functional Test
A live laser-confocal measurement was performed at 10× magnification using a printed reference target.
The following functions were successfully demonstrated:
System and controllers power on
Communication between the instrument, controllers, and computer
Optical color image acquisition
Optical focus and resolution
658 nm confocal laser imaging
Automatic Z height-range detection
Z-axis scanning
Three-dimensional surface reconstruction
Quantitative line-profile measurement
Motorized XY stage movement in all directions
Encoder position tracking
Measurement data capture and .vk4 file saving
Documented test results included:
Horizontal Profile Distance: 1,397.873 µm
Height Difference: 108.495 µm
Average Height: 137.194 µm
Profile Tilt: 4.438°
Automatic Z Scan Range: 393.345 µm
These values document the completed functional test and are not being represented as calibration standards or guaranteed performance specifications.
Included
Keyence VK-X150 measuring head and microscope stand
Keyence VK-X150K main controller
Keyence VK-S1000K electric stage controller
Motorized intelligent XY auto stage
10× objective
20× objective
50× objective
100× objective
Dell Precision 3450 control computer
Installed Keyence VK-X software environment
Interconnecting and power cables used during testing
Includes all accessories shown in the photographs.
Monitor, keyboard, mouse, sample, calibration standards, and accessories not shown or specifically identified are not included.
Condition
Pre-owned and cosmetically clean, with minor marks and signs consistent with previous laboratory or industrial use. No significant exterior damage was observed.
The system was assembled and tested through a complete laser-confocal 3D measurement. Optical imaging, color camera operation, laser imaging, automatic Z-range detection, Z scanning, 3D reconstruction, quantitative measurement, motorized XY stage control, and data capture were successfully demonstrated.
During initial startup, the motorized XY stage was positioned against a travel limit and stalled during the origin-return routine. After the stage was moved to a mid-travel position, it moved freely in all directions, and the position encoders tracked movement correctly.
The XY stage produces an audible buzzing or mechanical operating sound during movement. The stage moved and tracked accurately during testing, but the source of the sound was not further characterized. The buyer should reconfirm the origin-return procedure from a mid-travel position after installation.
The included software was used successfully with this instrument during testing. Future software-license transfer, updates, compatibility, and manufacturer support are not guaranteed.
The system is not represented as newly calibrated or manufacturer-certified. Installation, leveling, application-specific qualification, and verification of measurement performance are the buyer’s responsibility.
Shipping
Freight shipping is available throughout the United States. Shipping costs are quoted separately based on destination, delivery requirements, and final shipment dimensions.
Local pickup is available in San Diego, California.
Please complete the Freight & Local Pickup Request Form before purchasing to receive an accurate freight quote.
The Keyence VK-X150 is a 3D laser scanning confocal microscope designed for non-contact surface imaging, profile measurement, surface roughness analysis, height measurement, and three-dimensional reconstruction.
This complete system includes the VK-X150 measuring head, VK-X150K main controller, VK-S1000K electric stage controller, motorized intelligent XY stage, four objectives, and a Dell Precision 3450 control workstation with the Keyence VK-X software environment installed and operating with the instrument.
A complete end-to-end laser-confocal measurement was successfully performed. Testing demonstrated optical color imaging, laser imaging, automatic Z-range detection, Z-axis scanning, 3D reconstruction, quantitative profile measurement, motorized stage control, and data capture.
Features
Non-contact three-dimensional surface measurement
Pinhole confocal optical system
Optical color imaging
658 nm red semiconductor laser
Automatic Z-range detection
Three-dimensional surface reconstruction
Surface profile and height measurement
Motorized intelligent XY sample stage
Four-position objective turret
Complete 10×, 20×, 50×, and 100× objective set
Computer-based digital viewing
Keyence VK-X software installed on the included workstation
Suitable for surface texture, roughness, profile, height, and dimensional analysis
Designed for materials science, manufacturing, quality control, engineering, research, and failure analysis
Specifications
Manufacturer: Keyence
System Model: VK-X150
Product Type: 3D Laser Scanning Confocal Microscope
Series: VK-X100/X200
Main Controller: VK-X150K
Main Controller Serial Number: 1271011
Electric Stage Controller: VK-S1000K
Stage Controller Serial Number: 4B710001
Stage Type: Motorized Intelligent XY Auto Stage
Optical System: Pinhole Confocal
Laser Type: Red Semiconductor Laser
Laser Wavelength: 658 nm
Maximum Laser Output: 0.95 mW
Laser Classification: Class 2
Light-Receiving Element: 16-bit photomultiplier
Maximum Total Magnification: Up to 19,200×, depending on configuration
Field of View: Approximately 16 µm to 5,400 µm, depending on configuration
Laser Measurement Speed: 4 to 120 Hz
High-Speed Line Scanning: Up to 7,900 Hz
Objective Magnifications: 10×, 20×, 50×, and 100×
Manufacturing Date: April 2017
Country of Origin: Japan
Included Computer Specifications
Manufacturer: Dell
Model: Precision 3450
Processor: Intel Xeon W-1370
Processor Configuration: 8 cores / 16 threads
Memory: 16 GB RAM
Storage: 1 TB NVMe SSD
Operating System: Windows 10 Pro for Workstations
Installed Software: VK Viewer 2.8.1
Installed Software: VK Analyzer 3.8.0
Installed Software: Image Stitching 2.1.1
Remote-Control SDK installed
Documented Functional Test
A live laser-confocal measurement was performed at 10× magnification using a printed reference target.
The following functions were successfully demonstrated:
System and controllers power on
Communication between the instrument, controllers, and computer
Optical color image acquisition
Optical focus and resolution
658 nm confocal laser imaging
Automatic Z height-range detection
Z-axis scanning
Three-dimensional surface reconstruction
Quantitative line-profile measurement
Motorized XY stage movement in all directions
Encoder position tracking
Measurement data capture and .vk4 file saving
Documented test results included:
Horizontal Profile Distance: 1,397.873 µm
Height Difference: 108.495 µm
Average Height: 137.194 µm
Profile Tilt: 4.438°
Automatic Z Scan Range: 393.345 µm
These values document the completed functional test and are not being represented as calibration standards or guaranteed performance specifications.
Included
Keyence VK-X150 measuring head and microscope stand
Keyence VK-X150K main controller
Keyence VK-S1000K electric stage controller
Motorized intelligent XY auto stage
10× objective
20× objective
50× objective
100× objective
Dell Precision 3450 control computer
Installed Keyence VK-X software environment
Interconnecting and power cables used during testing
Includes all accessories shown in the photographs.
Monitor, keyboard, mouse, sample, calibration standards, and accessories not shown or specifically identified are not included.
Condition
Pre-owned and cosmetically clean, with minor marks and signs consistent with previous laboratory or industrial use. No significant exterior damage was observed.
The system was assembled and tested through a complete laser-confocal 3D measurement. Optical imaging, color camera operation, laser imaging, automatic Z-range detection, Z scanning, 3D reconstruction, quantitative measurement, motorized XY stage control, and data capture were successfully demonstrated.
During initial startup, the motorized XY stage was positioned against a travel limit and stalled during the origin-return routine. After the stage was moved to a mid-travel position, it moved freely in all directions, and the position encoders tracked movement correctly.
The XY stage produces an audible buzzing or mechanical operating sound during movement. The stage moved and tracked accurately during testing, but the source of the sound was not further characterized. The buyer should reconfirm the origin-return procedure from a mid-travel position after installation.
The included software was used successfully with this instrument during testing. Future software-license transfer, updates, compatibility, and manufacturer support are not guaranteed.
The system is not represented as newly calibrated or manufacturer-certified. Installation, leveling, application-specific qualification, and verification of measurement performance are the buyer’s responsibility.
Shipping
Freight shipping is available throughout the United States. Shipping costs are quoted separately based on destination, delivery requirements, and final shipment dimensions.
Local pickup is available in San Diego, California.
Please complete the Freight & Local Pickup Request Form before purchasing to receive an accurate freight quote.